Defect Analysis Model for Device Quality Inspection
Walmart & IIT Madras collaboration developing a deep-learning-based defect analysis system.
Walmart & IIT Madras collaboration developing a deep-learning-based defect analysis system.
Short description of portfolio item number 2 
Built a scalable pipeline to learn a unified 3D pose dictionary with semantic captions.
Developed a fully label-free TAL framework that learns spatio-temporal graph embeddings.
Built an ASTGCN + SOT framework to automatically detect biomechanical phase transitions.
Published in IEEE STAR-2025, 2025
Published at IEEE STAR-2025 (2025)
Published in IEEE STAR-2025, 2025
Published at IEEE STAR-2025 (2025)
Published in ICIP Satellite Workshop 2025, 2025
Published at ICIP Satellite Workshop 2025 (2025)
Published in arXiv 2025, 2025
Published at arXiv 2025 (2025)
Published in Under Review, 2026
Label-Free Skeleton-based Temporal Action Localization through Spectral Analysis (Under Review)
Published in Under Review, 2026
Throwing4: A Phase-Aligned Benchmark for Fine-Grained Throwing Analysis and Score Prediction (Under Review)